Al-Naggar, Ahmed Medhat Mohamed and El-Salam, Rabie Mohamed Abd and Yaseen, Walaa Yaseen Saad (2020) Yield Stability and Adaptability of 25 Grain Sorghum B-Lines across Six Environments in Egypt Using AMMI and GGE-Biplot Models. In: Advances in Agriculture and Fisheries Research Vol. 1. B P International, pp. 80-96. ISBN 978-93-89246-30-8
Full text not available from this repository.Abstract
Presence of G×E interaction reduces the correlation between genotypic and phenotypic parameters
and complicates progress of selection. Among several methods proposed for evaluation of the GE
interaction, the AMMI and GGE-biplot are the most informative models. The objective of this study
was to estimate the G×E interaction in sorghum parental lines and to identify sorghum B-lines of
stability and adaptability across different environments using the AMMI and GGE-biplot models. Six
environments with 25 sorghum B-lines were conducted at two locations in Egypt (Giza and
Shandaweel) in two years and two planting dates in one location (Giza). A randomized complete block
design was used in each environment (yield trial) with three replications. The AMMI analysis of
variance indicated that the genotype (G), environment (E) and GE interaction had significant influence
(p≤0.01) on sorghum grain yield. Based on AMMI model, BTX TSC-20 followed by ICSB-1808
showed both high yielding and stability across the test environments. However, ICSB-8001 (G11) and
BTX-407 (G21), showed maximum stability, but with moderate grain yield. Based on GGE-biplot
method, BTX TSC-20 (G25) was the winning genotype for the mega-environment which consists of
E1 and E3, ICSB-14 (G3) for the mega-environment (E2 and E4), while BTX 2-1 (G20) for E5 megaenvironment,
ICSB-88003 (G12) and ICSB-70 (G6) for the mega-environment E6. These genotypes
are the most adapted to the respective environments.
Item Type: | Book Section |
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Subjects: | Eurolib Press > Agricultural and Food Science |
Depositing User: | Managing Editor |
Date Deposited: | 22 Nov 2023 06:48 |
Last Modified: | 22 Nov 2023 06:48 |
URI: | http://info.submit4journal.com/id/eprint/3129 |